SMM3000X Series Source Measure Units

6½ Display digits (2,100,000 count)
Maximum acquisition rate of 100,000 points/s
Minimum programming and measuring resolution of 10fA/100nV
210V/3.03A(DC)/10.5A(pulsed) maximum output
Support DC, pulse, scanning and list output, with a minimum pulse width of 50μs
5-inch touch screen, supporting graphic and digital views.

Product Overview

SMM3000X series is an accurate source/measuring unit (SMU) instrument, which can output and measure voltage and current at the same time. It integrates the functions of current source, voltage source, voltmeter and ammeter, and is especially suitable for semiconductor characteristic analysis, nano-scale devices and materials, organic semiconductors and other testing applications.

	Channel Output	Display	Resolution	Setting Accuracy	Readback Accuracy	Price
SMM3311X	Single channel, ±210V/3.03A/31.8W	5” TFT color display	10fA/100nV	Voltage：0.015% + 225μV Current：0.1 % + 100 pA	Voltage：0.015% + 225μV Current：0.1 % + 100 pA	$4,880	Buy Now
SMM3312X	Dual channel, ±210V/3.03A/31.8W	5” TFT color display	10fA/100nV	Voltage：0.015% + 225μV Current：0.1 % + 100 pA	Voltage：0.015% + 225μV Current：0.1 % + 100 pA	$8,580	Buy Now

Key Features

Five-inch, high resolution capacitive touchscreen GUI
Source and measurement resolution down to 10 fA and 100 nV
The maximum display digits: 6½(21,000,00 count)
The maximum sampling rate is 100ksps, the sampling interval is 0.0005 PLC, and the maximum setting is 100 PLC.
Minimum trigger interval 10 μs.
Up to 100k points of internal storage space, supporting timestamps.
Four-quadrant precision power supply with single/dual-channel output and measurement
Voltage (±210 V) and current (± 3 A DC and ±10.5 A pulsed) sourcing capability
Five basic functions: voltage/current sourcing, voltage/current/resistance measurement
The minimum programmable pulse width is 50 μs.

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Product Characteristics

High-Precision Pulse Emulation View more

High-Precision Pulse Emulation

In pulse mode, the SMM3000X series delivers ±10.5 A pulsed current output with a minimum pulse width of 50 μs, enabling accurate emulation of transient operating conditions for power devices—such as switching loss characterization of GaN (gallium nitride) and SiC (silicon carbide) components—thereby providing robust support for power semiconductor R&D and testing.

Linear/Logarithmic Sweep View more

Linear/Logarithmic Sweep

The SMM3000X series supports both linear and logarithmic sweep modes, generating point-by-point voltage or current output from user-defined start to stop values at a fixed step size while automatically measuring and logging data at each point. This facilitates rapid characterization of semiconductor devices—such as diodes and transistors—across varying operating points, enabling acquisition of conduction (I‑V) curves for performance analysis and optimization.

Flexible Custom Sequencing View more

Flexible Custom Sequencing

List Mode allows users to define custom output sequences with a minimum interval of 10 μs. Parameter transitions can follow linear, non-linear, arbitrary, or fully user-specified patterns. The instrument sequentially outputs the programmed voltage or current values while simultaneously measuring and recording data—ideal for irregular transient tests and multi-segment stress profiling.

Data Visualization and Analysis View more

Data Visualization and Analysis

The SMM3000X series provides multiple display modes—Graph, Roll, and Measurement Results views—for comprehensive data analysis. The Graph view enables real-time curve plotting of mathematical operations, the Roll view displays time-domain waveforms, and the Measurement Results view presents statistical summaries of trace data. This multi-view architecture supports multi-dimensional parameter analysis for intuitive interpretation of test results.

Efficient Programmable Control View more

Efficient Programmable Control

Built on an advanced SCPI command set, the SMM3000X series supports remote control via USB and LAN interfaces. Users can operate the instrument through an embedded Web Server for quick setup or implement deep customization via SCPI programming to meet diverse test requirements. Socket communication over TCP/IP further enables seamless network integration for robust remote testing and control.